SPM Microscopy for nanotechnology and nanobiology
The term Scanning Probe Microscopy (SPM) indicates a broad class of techniques sharing a common feature: a probe performs a scan in close proximity of the sample surface. Depending on the type of probe, the system records variations of some physical parameters arising from the short range interaction between sample surface and probe. Some of SPM allow atomic resolution, and also some manipulation of structures in the nanometric range (e.g. nanografting, nanolithography, charge injection and displacement of structures). In this framework our group developed completely in house a novel Near Field Scanning Microwave Microscope (SMM), currently being used for the investigation of nanostructures (carbon nanotubes, graphene, nanoparticles etc) and of biological specimens (single myofibrils, myotubules, liposomes etc). SMM allows to recover sub-surface details and to perform a characterization of materials having different electromagnetic properties. The work in progress is intended to extend this technique to poorly conductive or insulating samples, as well as to "in liquid" scans, and to extend the work done in the optical range. Investigation is being performed to induce Electron Spin Resonance during SMM
Laboratory Microscopy Lab at DII
Contact Person Marco Farina
  • Cornell University Ithaca, NY (USA)
  • Lehigh University, Bethlehem MA (USA)
  • Joannes Kepler University, Linz (Austria)
  • Università G. D’Annunzio, Chieti (Italy)
  • U.S. Army Research Laboratory (Grant No. W911NF-17-1-0090)
  • U.S.A.F. Office of Scientific Research (Grant No. FA9550-17-1-0043)